Download Boundary-Scan Interconnect Diagnosis (Frontiers in by JosA© T. de Sousa, Peter Y.K. Cheung PDF

By JosA© T. de Sousa, Peter Y.K. Cheung

Show description

Read or Download Boundary-Scan Interconnect Diagnosis (Frontiers in Electronic Testing) PDF

Similar electronics books

Learn Electronics with Arduino

Have you puzzled how digital contraptions are created? Do you've got an concept for a brand new proof-of-concept tech equipment or digital toy yet haven't any approach of checking out the feasibility of the machine? have you ever accrued a junk field of digital components and at the moment are puzzling over what to construct? research Electronics with Arduino will resolution those inquiries to learning cool and leading edge functions for brand spanking new tech items utilizing amendment, reuse, and experimentation strategies.

Electronic Devices and Circuit Theory (11th Edition)

Digital units and Circuit concept, 11th variation, bargains an entire, complete survey, concentrating on all of the necessities it is very important be triumphant at the activity. atmosphere the traditional for almost 30 years, this hugely actual textual content is supported by way of powerful pedagogy and content material that's perfect for brand new scholars of this speedily altering box.

EDA: Where Electronics Begins

EDA (Electronics layout Automation) refers back to the computing device courses which are used to layout all of modern-day digital elements and items. the matter is that there are extra EDA instruments than you could throw a stick at, and the myriad ways that they are often used jointly will make even the most powerful brain boggle.

Extra info for Boundary-Scan Interconnect Diagnosis (Frontiers in Electronic Testing)

Example text

Memory chips are a good example of this (de Jong and van Wijngaarden, 1992). INTRODUCTION 13 Nonetheless, the general tendency is that the use of glue logic declines for various reasons: (1) full BS design requirement (2) rapid development of interface protocols, and (3) use of reconfigurable computing technology. , 1990). In regard to reason (2), an example is the use of the peripheral component interconnect (PCI) standard; this standard has greatly reduced the need for glue logic interfaces (Michel, 1994).

If the circuit passes this test it is deemed fault free. Otherwise, based on the response of the first test set, a few additional test vectors are computed on the fly and applied to the circuit. These additional vectors are supposed to diagnose the fault in question. , 1990). Two-step diagnosis seems attractive at first, but has some severe problems. First of all, compared to single-step strategies, where a single test set is applied, 12 Boundary-Scan Interconnect Diagnosis adaptive T&D is slower.

The random approach is a kind of Monte Carlo simulation where defects with a random size are randomly scattered over the layout. This Boundary-Scan Interconnect Diagnosiss 18 approach makes sense for ICs where defects of random size and location can occur in the layout. It also gives some measure of the occurrence probability of defects. However, large numbers of defects have to be generated in order to study an adequate number of possible faulty situations and their probabilities. This limits the size of the circuits that can be analyzed.

Download PDF sample

Rated 4.07 of 5 – based on 10 votes